Addressing in-field RAS Challenges for Data Center and Automotive Use Cases
Recent advances in automotive SOCs, AI accelerators, and HPC engines in data centers have led to an explosion in the adoption of emerging technology nodes and 3DIC/chiplet packages. We will discuss the Silent Data Corruption (SDC) challenges for these emerging SOCs in the field, and optimizing the SoC health using prognostics, test and analytic solutions, utilized for managing silicon lifecycle (SLM) for improved quality and compliance to Reliability Availability Serviceability (RAS) requirements across application domains.